发明名称 Method of designing and method of using a phase-shift mask
摘要 Method for utilizing halftoning structures (1704) to manipulate the relative magnitudes of diffraction orders to ultimately construct the desired projected-image. At the resolution limit of the mask maker, this is especially useful for converting strongly shifted, no-0<th>-diffraction-order, equal-line-and-space chromeless phase edges to weak phase-shifters that have some 0<th> order. Halftoning creates an imbalance in the electric field between the shifted regions, and therefore results in the introduction of the 0<th> diffraction order. <IMAGE>
申请公布号 EP1152288(B1) 申请公布日期 2005.08.03
申请号 EP20010303850 申请日期 2001.04.27
申请人 ASML MASKTOOLS B.V. 发明人 CHEN, JANG-FUNG;PETERSEN, JOHN S.
分类号 G03F1/00;G03F1/26;G03F1/32;G03F7/20;H01L21/027 主分类号 G03F1/00
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