发明名称 Method for fabricating semiconductor device
摘要 The present invention relates to a method for fabricating a semiconductor device. The method comprises the steps of: 1. A method for fabricating a semiconductor device, which comprises the steps of: forming a gate line on a semiconductor substrate; forming junction regions in the semiconductor substrate at both sides of the gate line; forming and selectively removing an interlayer insulating film on the substrate to form contact holes exposing the junction regions; forming plugs in the contact holes; and implanting impurity ions into the plugs; and annealing the junction regions.
申请公布号 US6927152(B2) 申请公布日期 2005.08.09
申请号 US20030738394 申请日期 2003.12.17
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JIN SEUNG WOO;LEE TAE HYEOK;KIM BONG SOO
分类号 H01L21/336;H01L21/425;H01L21/44;H01L21/8238;H01L21/8239;H01L21/8242;(IPC1-7):H01L21/425 主分类号 H01L21/336
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