发明名称 Semiconductor alignment aid
摘要 An alignment aid for semiconductor devices. The alignment aid includes an area having a high level of reflectivity and an adjacent area having a of low level of reflectivity. The area having a low level of reflectivity includes at least one layer of tiles located in an interconnect layer of a semiconductor device and located over active circuitry of the semiconductor device. In some examples, the spacings between the tiles in a scan direction of the alignment aid is less than the wavelength of a light (e.g. a laser light) used to scan the alignment aid. In other examples, the width of the tiles in a scan direction of the alignment aid is less than the wave length of a laser used to scan the alignment aid.
申请公布号 US6933523(B2) 申请公布日期 2005.08.23
申请号 US20030402539 申请日期 2003.03.28
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 SHECK STEPHEN G.
分类号 H01L;H01L21/302;H01L21/82;H01L21/8234;H01L23/29;H01L23/544;H01L23/58;H01L29/80;H01L31/0328;(IPC1-7):H01L23/58;H01L21/823 主分类号 H01L
代理机构 代理人
主权项
地址