发明名称 Semiconductor processing-purpose substrate detecting method and device, and substrate transfer system
摘要 A detecting device includes a sensor support body having a pair of arms, and an optical sensor having a combination of a light emitting unit and a light receiving unit disposed on one and the other of the arms, respectively. A control operation section controls a driving section and, with the arms inserted in a cassette, the sensor support body is moved, thereby performing a scanning operation for scanning the substrate by the optical sensor. The scanning operation is set such that a light beam is related to the substrate while vertically moving at a plurality of scanning positions. The control operation section finds out the presence of absence of the substrate and the position of the front end of the substrate within the cassette on the basis of data obtained from the optical sensor during scanning.
申请公布号 US2005242305(A1) 申请公布日期 2005.11.03
申请号 US20050174470 申请日期 2005.07.06
申请人 TOKYO ELECTRON LIMITED 发明人 OKA HIROKI
分类号 H01L21/67;H01L21/00;H01L21/68;(IPC1-7):G01V8/00;G01N21/86 主分类号 H01L21/67
代理机构 代理人
主权项
地址