发明名称 |
SOLVENT COMPOSITION AND METHOD FOR DEVELOPING RESIST |
摘要 |
PROBLEM TO BE SOLVED: To provide an excellent solvent composition without any collapse of a fine resist pattern when being dried after removing a rinsing agent. SOLUTION: The method includes: a step of applying and exposing a photoresist on the surface of a wafer; a developing step to develop the exposed resist with a developing solution; a first rinsing step of clean and remove the developing solution by using a water-based rinsing agent; and a second rinsing step to remove the water-based rinsing agent by using a solvent composition containing a fluorine-containing compound solvent and a fluorine-based surfactant, and a drying step to remove the solvent composition. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005338609(A) |
申请公布日期 |
2005.12.08 |
申请号 |
JP20040159564 |
申请日期 |
2004.05.28 |
申请人 |
ASAHI GLASS CO LTD |
发明人 |
OKAMOTO SHUICHI;SHIRAKAWA DAISUKE |
分类号 |
G03F7/32;H01L21/027;(IPC1-7):G03F7/32 |
主分类号 |
G03F7/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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