发明名称 METHOD AND DEVICE FOR INSPECTING TUNNELING MAGNETORESISTIVE EFFECT ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for inspecting a TMR element which are capable of validating the reliability of the TMR element easily, surely and accurately in a short time with a comparatively low applied voltage which scarcely causes damage to the TMR element. SOLUTION: Each time stress voltages different from each other in polarity are applied to the TMR element, resistance values of the TMR element are measured, respectively. A resistance change volume is obtained from the measured resistance values so as to evaluate the TMR element. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006060120(A) 申请公布日期 2006.03.02
申请号 JP20040242189 申请日期 2004.08.23
申请人 TDK CORP 发明人 HACHISUGA NOZOMI;SARUGI SHUNJI;KAGAMI TAKERO;INAGE KENJI
分类号 H01L43/12;G11B5/39;G11B5/455;H01L21/8246;H01L27/105 主分类号 H01L43/12
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