发明名称 IMAGING SYSTEMS WITH REAL-TIME DIGITAL TESTING CAPABILITIES
摘要 An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.
申请公布号 US2016295205(A1) 申请公布日期 2016.10.06
申请号 US201514675877 申请日期 2015.04.01
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 LIM Yan Ping;ENGELBRECHT Dennis;DAVIS Raymond Allen;HERNANDEZ Agustin
分类号 H04N17/00 主分类号 H04N17/00
代理机构 代理人
主权项 1. Image processing circuitry that produces an output data frame during a frame time interval, comprising: control circuitry coupled to an image sensor, wherein the image sensor comprises a plurality of pixels arranged in rows and columns, wherein the control circuitry is configured to output a first set of data during a first portion of the frame time interval and a second set of data during a second portion of the frame time interval that is subsequent to the first portion; a plurality of image processing blocks that are configured to process the first and second sets of row data output by the control circuitry; and a test pattern generator that is configured to output test patterns to the plurality of image processing blocks during the second portion of the frame time interval.
地址 Phoenix AZ US