发明名称 TIP TYPE PROBE MANUFACTURING METHOD, TIP TYPE PROBE AND TIP TYPE PROBE MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an easy and highly efficient manufacturing method of a tip type probe. SOLUTION: The manufacturing method of the tip type probe, having a metal film on the side surface of a truncated cone, constituted of a top surface and the side surface includes: a process for forming an etching mask, having a shape similar to the top surface on a substrate; a process for forming the truncated cone by the isotropic etching of the substrate using the etching mask as a mask material; a process for stopping the isotropic etching after the area of the top surface becomes smaller than the area of the etching mask; and a process for forming the metal film, by turning the film forming particles into the gap between the etching mask and the side surface. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009198295(A) 申请公布日期 2009.09.03
申请号 JP20080039862 申请日期 2008.02.21
申请人 SEIKO INSTRUMENTS INC 发明人 PARK MAJUNG;OMI MANABU
分类号 G01Q60/22;G01Q80/00;G11B5/02;G11B5/31 主分类号 G01Q60/22
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