| 摘要 |
The invention relates to an inspection system comprising a planar sheet material (1), a magnetic sensor (2), a memory unit (3), and a comparing unit (4) The planar sheet material (1) has, at least in some segments, a magnetizable layer (6) and an inspection field (7), in which the magnetizable layer (6) is magnetized. A microscopic fluctuation progression of the magnetization state of the magnetized layer (6) within the inspection field (7) is stored in the memory unit (3), wherein the magnetic sensor (2) is designed to read out the microscopic fluctuation progression of the magnetization state of the magnetized layer (6) within the inspection field (7), and wherein the comparing unit (4) is designed to check if the fluctuation progression measured by means of the magnetic sensor (2) matches the fluctuation progression stored in the memory unit (3). For an inspection method, according to the invention, in the case of an inspection, the microscopic fluctuation progression of the magnetization state of the magnetized layer (6) within the inspection field (7) is read out by means of a magnetic sensor and, by means of a comparing unit (4), it is checked whether the fluctuation progression measured by means of the magnetic sensor (2) matches the fluctuation progression stored in the memory unit (3). |
