发明名称 Method of substrate temperature control during high temperature wet processing
摘要 Methods are provided for processing a substrate in single substrate tool. In one embodiment, the method includes providing the substrate in the single substrate tool, applying a first processing fluid at a first temperature greater than 100° C. to a lower surface of the substrate to heat the substrate to approximately the first temperature, and applying a second processing fluid at a second temperature greater than 100° C. to an upper surface of the substrate.
申请公布号 US9490138(B2) 申请公布日期 2016.11.08
申请号 US201414565542 申请日期 2014.12.10
申请人 TEL FSI, INC. 发明人 Siefering Kevin L.
分类号 H01L21/311;H01L21/67 主分类号 H01L21/311
代理机构 Kagan Binder, PLLC 代理人 Kagan Binder, PLLC
主权项 1. A method for processing a substrate having a nitride film on the upper surface of the substrate in single substrate tool, the method comprising: providing the substrate having a nitride film on the upper surface of the substrate in the single substrate tool; applying a first processing fluid at a first temperature greater than 100° C. to a lower surface of the substrate to heat the substrate to approximately the first temperature, wherein the first processing fluid comprises phosphoric acid, sulfuric acid, or a mixture thereof; and applying a second processing fluid at a second temperature greater than 100° C. to an upper surface of the substrate to etch the nitride film on the upper surface of the substrate, wherein the second processing fluid comprises phosphoric acid, sulfuric acid, or a mixture thereof.
地址 Chaska MN US