发明名称 |
Method of manufacturing high breakdown voltage rectifiers |
摘要 |
A method of manufacturing rectifying device by cutting a lamination of semiconductor wafers each having a P-N junction formed therein along planes perpendicular to the plane of the wafer and subjecting the resultant divided series diode laminations to an etching treatment with a blend etching liquid composed of hydrogen fluoride, nitric acid and acetic acid. The etching liquid strongly acts upon the N-type region, while it weakly acts upon the P-type region, so that a configuration similar to that which would be obtained through a positive bevel treatment may be obtained. Thus, it is possible to obtain a high breakdown voltage rectifier which is hardly subject to destruction due to a transient reverse voltage.
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申请公布号 |
US3929531(A) |
申请公布日期 |
1975.12.30 |
申请号 |
US19730360080 |
申请日期 |
1973.05.14 |
申请人 |
MATSUSHITA ELECTRONICS CORPORATION |
发明人 |
HATTORI, HIROTSUGU;TAKAYAMA, YUICHIRO |
分类号 |
H01L21/306;H01L25/07;H01L29/00;(IPC1-7):H01L21/30;H01L21/30 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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