发明名称 Method of manufacturing high breakdown voltage rectifiers
摘要 A method of manufacturing rectifying device by cutting a lamination of semiconductor wafers each having a P-N junction formed therein along planes perpendicular to the plane of the wafer and subjecting the resultant divided series diode laminations to an etching treatment with a blend etching liquid composed of hydrogen fluoride, nitric acid and acetic acid. The etching liquid strongly acts upon the N-type region, while it weakly acts upon the P-type region, so that a configuration similar to that which would be obtained through a positive bevel treatment may be obtained. Thus, it is possible to obtain a high breakdown voltage rectifier which is hardly subject to destruction due to a transient reverse voltage.
申请公布号 US3929531(A) 申请公布日期 1975.12.30
申请号 US19730360080 申请日期 1973.05.14
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 HATTORI, HIROTSUGU;TAKAYAMA, YUICHIRO
分类号 H01L21/306;H01L25/07;H01L29/00;(IPC1-7):H01L21/30;H01L21/30 主分类号 H01L21/306
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