发明名称 |
PARTICLE ANALYSIS APPARATUS, OBSERVATION APPARATUS, PARTICLE ANALYSIS PROGRAM AND PARTICLE ANALYSIS METHOD |
摘要 |
A particle analysis apparatus includes: an acquisition unit that acquires a plurality of images each captured at a different time in each of which a particle moving in a predetermined direction in a medium is imaged; and a determination unit that determines, based on a movement amount of a particle due to Brownian motion in the medium, whether or not an image of a first particle included in an image captured at a first time of the plurality of images acquired by the acquisition unit and an image of a second particle included in an image captured at a second time which is different from the first time of the plurality of images acquired by the acquisition unit are images indicating the same particle. |
申请公布号 |
US2016320289(A1) |
申请公布日期 |
2016.11.03 |
申请号 |
US201615210158 |
申请日期 |
2016.07.14 |
申请人 |
NIKON CORPORATION |
发明人 |
TANAKA Daishi;OSAWA Hisao;SUZUKI Kuno |
分类号 |
G01N15/14;G01N21/53 |
主分类号 |
G01N15/14 |
代理机构 |
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代理人 |
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主权项 |
1. A particle analysis apparatus, comprising:
an acquisition unit configured to acquire a plurality of images each captured at a different time in each of which a particle moving in a predetermined direction in a medium is imaged; and a determination unit configured to determine, based on a movement amount of a particle due to Brownian motion in the medium, whether or not an image of a first particle included in an image captured at a first time of the plurality of images acquired by the acquisition unit and an image of a second particle included in an image captured at a second time which is different from the first time of the plurality of images acquired by the acquisition unit are images indicating the same particle. |
地址 |
Tokyo JP |