发明名称 PARTICLE ANALYSIS APPARATUS, OBSERVATION APPARATUS, PARTICLE ANALYSIS PROGRAM AND PARTICLE ANALYSIS METHOD
摘要 A particle analysis apparatus includes: an acquisition unit that acquires a plurality of images each captured at a different time in each of which a particle moving in a predetermined direction in a medium is imaged; and a determination unit that determines, based on a movement amount of a particle due to Brownian motion in the medium, whether or not an image of a first particle included in an image captured at a first time of the plurality of images acquired by the acquisition unit and an image of a second particle included in an image captured at a second time which is different from the first time of the plurality of images acquired by the acquisition unit are images indicating the same particle.
申请公布号 US2016320289(A1) 申请公布日期 2016.11.03
申请号 US201615210158 申请日期 2016.07.14
申请人 NIKON CORPORATION 发明人 TANAKA Daishi;OSAWA Hisao;SUZUKI Kuno
分类号 G01N15/14;G01N21/53 主分类号 G01N15/14
代理机构 代理人
主权项 1. A particle analysis apparatus, comprising: an acquisition unit configured to acquire a plurality of images each captured at a different time in each of which a particle moving in a predetermined direction in a medium is imaged; and a determination unit configured to determine, based on a movement amount of a particle due to Brownian motion in the medium, whether or not an image of a first particle included in an image captured at a first time of the plurality of images acquired by the acquisition unit and an image of a second particle included in an image captured at a second time which is different from the first time of the plurality of images acquired by the acquisition unit are images indicating the same particle.
地址 Tokyo JP