发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of suppressing ununiformity in dopant concentration of a semiconductor layer on a diffraction grating.SOLUTION: A method of manufacturing a semiconductor device includes the following steps of: forming on a semiconductor substrate a diffraction grating layer having unevenness on a surface; forming a first semiconductor layer on the unevenness of the diffraction grating layer; and forming a second semiconductor layer on the first semiconductor layer. A set growth speed of the first semiconductor layer is set to be smaller than that of the second semiconductor layer.SELECTED DRAWING: Figure 3
申请公布号 JP2016219667(A) 申请公布日期 2016.12.22
申请号 JP20150104918 申请日期 2015.05.22
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MORI DAIKI
分类号 H01S5/12;H01L21/205 主分类号 H01S5/12
代理机构 代理人
主权项
地址