发明名称 PROCESS OF FILLING THE HIGH ASPECT RATIO TRENCHES BY CO-FLOWING LIGANDS DURING THERMAL CVD
摘要 Implementations of the present disclosure generally relate to methods for forming thin films in high aspect ratio feature definitions. In one implementation, a method of processing a substrate in a process chamber is provided. The method comprises flowing a boron-containing precursor comprising a ligand into an interior processing volume of a process chamber, flowing a nitrogen-containing precursor comprising the ligand into the interior processing volume and thermally decomposing the boron-containing precursor and the nitrogen-containing precursor in the interior processing volume to deposit a boron nitride layer over at least one or more sidewalls and a bottom surface of a high aspect ratio feature definition formed in and below a surface of a dielectric layer on the substrate.
申请公布号 US2016293483(A1) 申请公布日期 2016.10.06
申请号 US201615083590 申请日期 2016.03.29
申请人 Applied Materials, Inc. 发明人 MANNA Pramit;CHENG Rui;CHAN Kelvin;MALLICK Abhijit Basu
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of processing a substrate, comprising: flowing a boron-containing precursor comprising a ligand into an interior processing volume of a process chamber; flowing a nitrogen-containing precursor comprising the ligand into the interior processing volume; and thermally decomposing the boron-containing precursor and the nitrogen-containing precursor in the interior processing volume to deposit a boron nitride layer over at least one or more sidewalls and a bottom surface of a high aspect ratio feature definition formed in and below a surface of a dielectric layer on the substrate.
地址 Santa Clara CA US