发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high-performance semiconductor device including an oxide semiconductor.SOLUTION: A manufacturing method for a semiconductor device includes: forming an oxide semiconductor layer on a substrate; forming a first conductive layer on the oxide semiconductor layer; forming a second conductive layer on the first conductive layer; forming a first pattern by etching the second conductive layer; expanding the first pattern by oxidation; forming a second pattern to serve as a source electrode and a drain electrode by etching the first conductive layer using the expanded first pattern as a mask; forming a gate insulating layer covering the expanded first pattern, the second pattern, and the oxide semiconductor layer; and forming a gate electrode on the gate insulating layer.SELECTED DRAWING: Figure 1
申请公布号 JP2016171355(A) 申请公布日期 2016.09.23
申请号 JP20160129748 申请日期 2016.06.30
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MARUYAMA JUNYA;ENDO TAICHI
分类号 H01L21/336;H01L21/28;H01L29/786 主分类号 H01L21/336
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