发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a high-performance semiconductor device including an oxide semiconductor.SOLUTION: A manufacturing method for a semiconductor device includes: forming an oxide semiconductor layer on a substrate; forming a first conductive layer on the oxide semiconductor layer; forming a second conductive layer on the first conductive layer; forming a first pattern by etching the second conductive layer; expanding the first pattern by oxidation; forming a second pattern to serve as a source electrode and a drain electrode by etching the first conductive layer using the expanded first pattern as a mask; forming a gate insulating layer covering the expanded first pattern, the second pattern, and the oxide semiconductor layer; and forming a gate electrode on the gate insulating layer.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016171355(A) |
申请公布日期 |
2016.09.23 |
申请号 |
JP20160129748 |
申请日期 |
2016.06.30 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
MARUYAMA JUNYA;ENDO TAICHI |
分类号 |
H01L21/336;H01L21/28;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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