发明名称 High-resolution, cryogenic, side-entry type specimen stage
摘要 A high-resolution, cryogenic side-entry type specimen stage includes a copper block within which a specimen can be positioned in the electron beam of an electron microscope, one end of the copper block constituting a specimen heat exchanger, means for directing a flow of helium at cryogenic temperature into the heat exchanger, and electrical leads running from the specimen to the exterior of the microscope for four point D.C. electrical resistivity measurements.
申请公布号 US4162401(A) 申请公布日期 1979.07.24
申请号 US19780906816 申请日期 1978.05.17
申请人 U S OF AMERICA ENERGY DEPARTMENT 发明人 KING, WAYNE E;MERKLE, KARL L
分类号 H01J37/20;(IPC1-7):G01N23/00 主分类号 H01J37/20
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