APPARATUS FOR MEASURING ELECTRIC PARAMETERS OF MATRIX ELECTRONIC ELEMENTS,申请号SU19772538191-传众专利搜索

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发明名称	APPARATUS FOR MEASURING ELECTRIC PARAMETERS OF MATRIX ELECTRONIC ELEMENTS
摘要
申请公布号	SU811159(A1)	申请公布日期	1981.03.07
申请号	SU19772538191	申请日期	1977.10.27
申请人	ANDREEV SERGEJ N,SU;ZHELBAKOVA ELENA V,SU;MALYUTIN NIKOLAJ V,SU;SHULENIN EVGENIJ A,SU	发明人	ANDREEV SERGEJ N,SU;ZHELBAKOVA ELENA V,SU;MALYUTIN NIKOLAJ V,SU;SHULENIN EVGENIJ A,SU
分类号	G01R31/26;G01R31/27;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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