发明名称 |
PATTERN FORMING MATERIAL |
摘要 |
PURPOSE:To obtain a material forming the pattern of a circuit such as an integrated circuit and having high sensitivity and high resolution by using a copolymer contg. a specified percentage of tert-butyl methacrylate units as a resist material against deep ultraviolet rays. CONSTITUTION:A copolymer contg. 20-95% tert-butyl methacrylate units represented by formula I is used as a resist material. This copolymer is represented by formula II. This resist is fit for lithography with deep ultraviolet rays of 180- 350nm wavelengths and has superior resolution and sensitivity with a small quantity of exposure in the formation of a <=1mu minute pattern. |
申请公布号 |
JPS5629232(A) |
申请公布日期 |
1981.03.24 |
申请号 |
JP19790103521 |
申请日期 |
1979.08.16 |
申请人 |
FUJITSU LTD |
发明人 |
YONEDA YASUHIRO;KITAMURA TATEO;NAITOU JIROU;KITAKOUJI TOSHISUKE |
分类号 |
G03F7/20;G03C1/72;G03F7/038;G03F7/039;H01L21/027;H01L21/30 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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