发明名称 Hall effect thickness measuring instrument.
摘要 <p>A Hall effect thickness measuring device includes a probe assembly 12 having a magnet 52 and a Hall sensor 54 mounted therein. The Hall sensor 54 is used to measure thickness of a coating on a substrate when either the coating or substrate or both are ferromagnetic by measuring the intensity of the magnetic flux through the Hall sensor, which depends upon the thickness of the coating. A thermistor 70 is provided to modify the measurement signal produced by the Hall sensor 54 to compensate for variations in the signal due to temperature fluctuations of the Hall sensor.</p>
申请公布号 EP0028487(A1) 申请公布日期 1981.05.13
申请号 EP19800303766 申请日期 1980.10.23
申请人 UPA TECHNOLOGY, INC. 发明人 LIEBER, DEREK;GOLICK, SIDNEY
分类号 G01B7/06;G01B7/00;G01D5/14;(IPC1-7):01B7/10 主分类号 G01B7/06
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