| 摘要 |
PURPOSE:To perform measurement of which accuracy is the same in the center and the periphery by correcting the uneven quantities of light by multiplying the output of a solid state scanning element by the inverse number of the distribution in the quantities of light. CONSTITUTION:The longitudinal direction of the chart line 46a of a square wave chart 46 is aligned in parallel to the arraying direction of a lens array 2, and the arraying direction of a solid state scanning element 52 is aligned to the direction intersecting orthogonally with the longitudinal direction of the chart line 46a. The array 2 is scanned by moving the array 2, and the output of the element 52 is inputted to an inverse number multiplier 810. Also, this output is removed of the frequency components of the chart by a filter 800 and is inputted to the multiplier 810. The output of the multiplier 810 is inputted via an A/D converter 82 to a central processor 73, and an auxiliary calculation value is determined from the sum and difference of the adjacent maximum and minimum values of the output of the solid state scanning element, and an MTF is determined from the average thereof. Thereby, the MTF eliminating the influence of the uneven quantities of light in all directions of the lens array is determined. |
