发明名称 TESTING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable checking of all of desired tests at a stage when products are delivered from a manufacturer, by a method wherein it is previously tested whether or not a driver of a P-PROM has an ability to absorb a writing current. CONSTITUTION:A P-ROM has several output terminals and a terminal, wherethrough a writing current flows, is combined with the output terminal, which is utilized for testing an ability for a driver, selected by a decoder, to absorb a current by a method wherein a current, having no possibility of simultaneously writing a memory cell, is caused to flow from each output terminal to the memory cell connected to each output terminal selected by a decoder. Thus, it can be tested whether or not the driver has an ability to absorb a writing current without destroying the memory cell, and all of the desired tests can be checked at a stage when poducts are delivered from the manufacturer.
申请公布号 JPS5740660(A) 申请公布日期 1982.03.06
申请号 JP19800117388 申请日期 1980.08.26
申请人 NIPPON DENKI KK 发明人 MASUDA HAJIME
分类号 G01R31/26;G11C29/00;G11C29/56 主分类号 G01R31/26
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