发明名称 FORMING METHOD FOR ELECTRODE METAL OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To increase adhesive strength, and to enable heat treatment at a low temperature by evaporating Ni on the surface of a Si substrate to which a P-N junction is formed, shaping a Ni silicide layer at a low temperature and forming Ni and Au plating layers onto the silicide layer. CONSTITUTION:Ni is evaporated on the surface of the mirror-surface Si semiconductor substrate 1 to which the predetermined P-N junction is molded previously. The substrate 1 is heated at 440-550 deg.C in N2 or N2 and H2 gas atrmosphere, and the Ni silicide layer 2 is formed. Ni is removed, and the Ni plating layer 3 and the Au plating layer 4 are shaped. When the electrode metal is formed and temperature compensating plate made of Mo, etc. is soldered, the Ni of the layer 3 is sintered into the layer 2 when the temperature of heating is made 440- 550 deg.C, and the adhesive strength is increased as compared to the case when the temperature is made 440 deg.C or lower.
申请公布号 JPS57154829(A) 申请公布日期 1982.09.24
申请号 JP19810039511 申请日期 1981.03.20
申请人 NIHON INTERNATIONAL SEIRIYUUKI KK 发明人 KIZAKI MASAHIKO
分类号 H01L21/28;H01L21/285;H01L21/60 主分类号 H01L21/28
代理机构 代理人
主权项
地址