发明名称 FORMING METHOD FOR INSULATING FILM
摘要 PURPOSE:To improve reliability by using CO2 as an oxidizing gas when plasma is generated in a reaction gas containing silicon hydride and the oxidizing gas and an insulating film consisting of glass containing Si and O is formed. CONSTITUTION:A lower electrode 3 made of Al and a discoid upper electrode 4 made of stainless steel opposed to the electrode 3 are mounted into a bell jar 1 for a CVD device for plasma deposition. A reaction gas system consists of PH3- SiH4-CO2-Ar. PH3 and SiH4 are introduced from the lower section of the electrode 3 while using Ar as a diluting gas. CO2, on the other hand, is introduced from the bottom of the bell jar 1, and supplied to a reaction chamber 7 through the through-holes 5 of the electrode 3. A semiconductor wafer 6 is set while the upper section of the surface is downward directed on the electrode 4. The reaction gas is plasma-excited in the reaction chamber 7, and the insulating film is deposited onto the wafer 6.
申请公布号 JPS57192032(A) 申请公布日期 1982.11.26
申请号 JP19810076553 申请日期 1981.05.22
申请人 HITACHI SEISAKUSHO KK 发明人 TAKAMATSU AKIRA;SHIBATA MIYOKO;YOSHIMI TAKEO
分类号 C23C16/40;H01L21/316;H01L21/768;(IPC1-7):01L21/316 主分类号 C23C16/40
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