发明名称 SEMICONDUCTOR WAFER THERMAL PROCESSING APPARATUS
摘要 PURPOSE:To suppress local furnace temperature rise by partitioning a thermal processing furnace into a patterning chamber and an oxidation processing chamber with a shielding plate, coupling both chambers by a through hole provided to the shielding plate and by providing a cooling apparatus for lowering a patterning chamber temperature. CONSTITUTION:A cap 4 is provided to an opening area of quartz furnace tube 3 forming the processing furnace and a gas exhausting hole 4a is provided at the center thereof. A semiconductor wafer 6 is mounted on a boat 5. The interior of furnace pipe 3 is partitioned by a shielding plate 17 into an oxidation processing chamber A and patterning chamber B. Both chambers are coupled by a through hole 18. A quartz pipe 19 forms a cooling device, and both ends are located at the outside of furnace pipe 3, while the intermediate part is wound around the longitudinal direction of furnace pipe 3 along the internal wall surface of the chamber B. Thus, an inlet port 20, and exit port 22 of the cooling gas 21 are provided.
申请公布号 JPS58116737(A) 申请公布日期 1983.07.12
申请号 JP19810210408 申请日期 1981.12.30
申请人 OKI DENKI KOGYO KK 发明人 KUROISHI KENICHI
分类号 H01L21/31;H01L21/316;(IPC1-7):01L21/316 主分类号 H01L21/31
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