| 主权项 |
1. A semiconductor device comprising:
a plurality of data pads; a plurality of data buffers each suitable for buffering a signal inputted through a first input node using a voltage inputted through a second input node, and outputting the buffered signal; a plurality of driving units suitable for pull-up driving or pull-down driving output nodes of the plurality of data buffers in response to the outputs of the plurality of data buffers, respectively; and a calibration control unit suitable for generating a test signal in a calibration mode, adjusting the level of the test signal, receiving outputs of the plurality of driving units while adjusting the level of the test signal, and adjusting drivabilities of the plurality of driving units such that the logical values of the outputs of the plurality of driving units transit when the test signal has a target level, wherein data of the corresponding data pad is inputted to the first input node, and a reference voltage is applied to the second input node, and in the calibration mode, the test signal is inputted to the first input node, and a test voltage is applied to the second input node. |
