发明名称 DYNAMIC TYPE MEMORY STORAGE
摘要 PURPOSE:To prevent malfunction due to alpha-rays by making a time constant given by a resistor of a high-resistance wiring layer forming a capacitor gate electrode and the capacitance of a capacitor larger than the duration of a funnelling effect. CONSTITUTION:The electrode P opposed to a memory node N of the capacitor is formed by the high-resistance wiring layer R, and connected to a word line WL' of an adjacent line. The time constant CR given by the layer R and capacitance C is set to a value larger than a time constant of funnelling. When the node N collects electrons formed in an extremely short time and reaches a low level, the opposite electrode P follows up to the node N by capacitive coupling and potential drops, and the electrode begins to slowly recover to a level of the line WL' at the time constant CR. The electrode P is regarded as floating in a time sufficiently shorter than the time constant CR while electrons are not collected when a time shorter then the time constant CR passes.
申请公布号 JPS58202565(A) 申请公布日期 1983.11.25
申请号 JP19820085742 申请日期 1982.05.21
申请人 TOKYO SHIBAURA DENKI KK 发明人 FUJII HIDETAKE;UCHIDA YUKIMASA;IIZUKA TETSUYA
分类号 G11C11/401;G11C11/404;H01L21/8242;H01L27/10;H01L27/108 主分类号 G11C11/401
代理机构 代理人
主权项
地址