| 摘要 |
An interface test device for testing a circuit, the interface test device including a module assembly including a plurality of modules, wherein a test block assembly is formed from individual test blocks that are arranged at one another in parallel and fixated at one another, wherein a test plug assembly is formed from individual test plugs that are arranged at one another other in parallel and fixated at one another, wherein a movement of a lever arm out of a plane of an insertion direction of the test plug assembly into the test block assembly is transferred by strut elements to pinions of the test plug assembly and inserts test fingers of the test plug assembly into openings of the test block assembly, wherein one of the test fingers of the test plug assembly opens a medium to high voltage monitoring circuit. |
| 主权项 |
1. An interface test device for testing a circuit, the interface test device comprising:
a module assembly including a plurality of modules, each module configured to open and close at least one medium to high voltage monitoring circuit and the module assembly including a test block assembly and a test plug assembly, at least one pair of contacts biased towards each other that are electrically connected and in line with the at least one medium to high voltage monitoring circuit for each module; and a test circuit, wherein the test circuit is connected to the at least one medium to high voltage monitoring circuit before or substantially simultaneously with the at least one medium to high voltage monitoring circuit being opened, wherein each module is configured to provide at least one output based upon at least one parameter of the at least one medium to high voltage monitoring circuit to the test circuit in order to measure the at least one parameter by an external tester connected to the test circuit, wherein the test block assembly is formed from individual test blocks that are arranged at one another in parallel and fixated at one another, wherein the test plug assembly is formed from individual test plugs that are arranged at one another in parallel and fixated at one another, wherein the test plug assembly is movably supported between two side pieces attached at the test block assembly and respectively including guide slots for pinions of the test plug assembly, wherein the side pieces are removably attached at a front face of the test block assembly, wherein a lever arm is pivotably attached at the two side pieces, wherein two strut elements are pivotably attached at the lever arm and pivotably attached at the pinions of the test plug assembly at opposite sides of the test plug assembly, wherein a movement of the lever arm out of a plane of an insertion direction of the test plug assembly into the test block assembly is transferred by the strut elements to the pinions of the test plug assembly and inserts test fingers of the test plug assembly into openings of the test block assembly, and wherein one of the test fingers of the test plug assembly opens the at least one medium to high voltage monitoring circuit. |
