发明名称 METHOD FOR PREPARING SOLID STATE SAMPLE FOR ANALYSIS
摘要 PURPOSE:To obtain three kinds of samples continuously, by cutting one metal test piece by one lathe without lubrication, obtaining a cut powder sample, then cutting a part of the sample in a protruded shape, cutting the sample to obtain a chip shaped sample, smoothly finishing the surface of the remaining part finally, and obtaining a solid state piece sample. CONSTITUTION:A test piece S of a raw material is attached to a chuck 1 of, e.g., a turret type automatic lathe. At first, the unnecessary part of the sample with the length of 80mm. is cut into 30mm. without lubrication. Thereafter, a part 2 of the sample shown by diagonal lines is cut by a roughing tool, and a post shaped part 2 having a height of 10mm. and a diameter of 8-12mm. is made to remain at the central part. Then the post shaped part 2 is cut into the shape with a diameter of 3-6mm.. A cut powder sample is obtained at this time. Then the protruded part 2 is cut away so as to obtain a chip shaped sample. The chip shaped sample and the cut powder sample are used for chemical analysis or flame analysis. Then, a remaining small projection 3, which remains when the protruded part 2 is cut away, is removed, and the end surface is smoothly finished. Thus a sample for spark light analysis or X ray analysis is obtained. In this way, three kinds of the samples are obtained continuously in a short time.
申请公布号 JPS5960241(A) 申请公布日期 1984.04.06
申请号 JP19820172431 申请日期 1982.09.29
申请人 SHIMAZU SEISAKUSHO KK 发明人 FUKUI ISAO;HIRANO TAKAHIDE
分类号 G01N1/28;(IPC1-7):01N1/28 主分类号 G01N1/28
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