| 发明名称 |
HALL EFFECT DEVICE TEST CIRCUIT |
| 摘要 |
<p>HALL EFFECT DEVICE TEST CIRCUIT A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, a voltage switching circuit, a comparison circuit, a retriggerable monostable multivibrator circuit and a visual indicator circuit are included. The comparison circuit compares the Hall effect device switching voltage to a predetermined threshold and controls the multivibrator circuit which causes a visual pass/fail signal to be provided.</p> |
| 申请公布号 |
CA1193663(A) |
申请公布日期 |
1985.09.17 |
| 申请号 |
CA19830430540 |
申请日期 |
1983.06.16 |
| 申请人 |
GTE AUTOMATIC ELECTRIC INCORPORATED |
发明人 |
THOMPSON, ROBERT C.;VAN HUSEN, HENDRIK W. |
| 分类号 |
G01R15/20;(IPC1-7):G01R31/26;H01L21/66 |
主分类号 |
G01R15/20 |
| 代理机构 |
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代理人 |
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| 主权项 |
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