发明名称 CORRECTING METHOD FOR DEFECT IN SYNCHRONIZATION
摘要 PURPOSE:To perform inspection with good accuracy, by measuring the synchronous shift amount generated in a printed matter inspection apparatus in the upstream side within several picture patterns with respect to the feed direction of printed matter and applying feed forward control to the picture pattern inspection apparatus provided in the downstream side on the basis of the measured result to correct synchronous shift. CONSTITUTION:A printed matter inspection apparatus is constituted so that the picture pattern information of each picture pattern 3 is scanned by one line by the line sensor of a detection part in order to inspect the state after printing of front and back four colors while the timing of sampling is taken by a start mark detector 23 and the reference transmitter assembled in a processing circuit 6 and a reference signal is compared with density level by the processing circuit 6 to judge a printing state. At this time, the synchronous shift amount of sampling is measured by an inspection device 23 in the upstream side within several picture patterns with respect to a feed direction and, on the basis of this measured result, feed forward control is applied to the picture pattern inspection apparatus 4 in the downstream side and, therefore, synchronous inferiority generated various causes is corrected and picture element information can be taken in by a definite inspection line and inspection with high accuracy can be performed.
申请公布号 JPS6168251(A) 申请公布日期 1986.04.08
申请号 JP19840192045 申请日期 1984.09.13
申请人 MITSUBISHI HEAVY IND LTD;TOPPAN PRINTING CO LTD 发明人 ITAYA SHIGERU;SHIMADA HITOAKI;MATSUNAGA YUZO;KAWADA NORIYUKI;MASUDA TOSHIAKI
分类号 B41F33/14;B41F33/00 主分类号 B41F33/14
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