发明名称 |
METHOD OF FORMING PATTERN |
摘要 |
PURPOSE:To form an ultrafine pattern by exposing a positive type electron beam resist with large exposure amount, and then developing it only with isopropyl alcohol. CONSTITUTION:After a positive type electron beam resist using as a developer mixture solution of isopropyl alcohol and other organic solvent is exposed in the exposure amount of twice or more than the exposure amount of the case of using a developer, a pattern developed with the isopropyl alcohol is formed. Thus, a sensitivity line near the ideal characteristics can be performed to form an ultrafine resist pattern. |
申请公布号 |
JPS6170719(A) |
申请公布日期 |
1986.04.11 |
申请号 |
JP19840192875 |
申请日期 |
1984.09.14 |
申请人 |
MATSUSHITA ELECTRONICS CORP |
发明人 |
YAMASHITA HIROSHI;TODOKORO YOSHIHIRO |
分类号 |
C08F20/14;C08F20/00;G03F7/26;G03F7/30;H01L21/027;H01L21/30 |
主分类号 |
C08F20/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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