发明名称 METHOD OF FORMING PATTERN
摘要 PURPOSE:To form an ultrafine pattern by exposing a positive type electron beam resist with large exposure amount, and then developing it only with isopropyl alcohol. CONSTITUTION:After a positive type electron beam resist using as a developer mixture solution of isopropyl alcohol and other organic solvent is exposed in the exposure amount of twice or more than the exposure amount of the case of using a developer, a pattern developed with the isopropyl alcohol is formed. Thus, a sensitivity line near the ideal characteristics can be performed to form an ultrafine resist pattern.
申请公布号 JPS6170719(A) 申请公布日期 1986.04.11
申请号 JP19840192875 申请日期 1984.09.14
申请人 MATSUSHITA ELECTRONICS CORP 发明人 YAMASHITA HIROSHI;TODOKORO YOSHIHIRO
分类号 C08F20/14;C08F20/00;G03F7/26;G03F7/30;H01L21/027;H01L21/30 主分类号 C08F20/14
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