| 摘要 |
PURPOSE:To readily discover a microscope observing inspection before sealing an element applied with an external force to the surface of an element by forming a regular pattern of similar shape having a moire, lattice or a common center on the protective surface of the element. CONSTITUTION:A regular pattern 10 is formed by a material different from a surface protective film on a surface protective film 8. Individual strips which form a regular pattern have, for example, 0.5-2.0mum of thickness, 3-10mum of width and 5-20mum of an interval between the strips, and the regular pattern includes, for example, similar rectangle groups having moire, lattice, concentric or common center. With such a structure, the pattern on the surface protective film applied with an external force to the surface of the element is deformed and the regularity of the pattern on the portion is disordered. Accordingly, the discovery of the malfunction due to the observing inspection can be ready. |
