发明名称 METHOD AND APPARATUS FOR SURFACE DIAGNOSTICS
摘要 <p>METHOD AND APPARATUS FOR SURFACE DIAGNOSTICS Method and apparatus for mass spectral analysis of unknown species of matter present on a surface even in extremely low concentrations. A probe beam such as an ion beam, electron beam or laser is directed to the surface under examination to remove a sample of material. An untuned, high-intensity laser is directed to a spatial region proximate to the surface. The laser has sufficient intensity to induce a high degree of nonresonant, and hence non-selective, photoionization of the sample of material within the laser beam. The non-selectively ionized sample is then subjected to mass spectral analysis to determine the nature of the unknown species</p>
申请公布号 CA1220879(A) 申请公布日期 1987.04.21
申请号 CA19840467335 申请日期 1984.11.08
申请人 SRI INTERNATIONAL 发明人 BECKER, CHRISTOPHER H.;GILLEN, KEITH T.;BUTTRILL, SIDNEY E., JR.
分类号 G01N23/225;H01J37/252;H01J49/40;H01L21/00;(IPC1-7):G01N21/63;H01J49/16 主分类号 G01N23/225
代理机构 代理人
主权项
地址