发明名称 |
METHOD AND APPARATUS FOR SURFACE DIAGNOSTICS |
摘要 |
<p>METHOD AND APPARATUS FOR SURFACE DIAGNOSTICS Method and apparatus for mass spectral analysis of unknown species of matter present on a surface even in extremely low concentrations. A probe beam such as an ion beam, electron beam or laser is directed to the surface under examination to remove a sample of material. An untuned, high-intensity laser is directed to a spatial region proximate to the surface. The laser has sufficient intensity to induce a high degree of nonresonant, and hence non-selective, photoionization of the sample of material within the laser beam. The non-selectively ionized sample is then subjected to mass spectral analysis to determine the nature of the unknown species</p> |
申请公布号 |
CA1220879(A) |
申请公布日期 |
1987.04.21 |
申请号 |
CA19840467335 |
申请日期 |
1984.11.08 |
申请人 |
SRI INTERNATIONAL |
发明人 |
BECKER, CHRISTOPHER H.;GILLEN, KEITH T.;BUTTRILL, SIDNEY E., JR. |
分类号 |
G01N23/225;H01J37/252;H01J49/40;H01L21/00;(IPC1-7):G01N21/63;H01J49/16 |
主分类号 |
G01N23/225 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|