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发明名称
TESTING SYSTEM OF CONTROL TURN-OFF SEMICONDUCTOR IN CIRCUIT
摘要
申请公布号
JPS62156575(A)
申请公布日期
1987.07.11
申请号
JP19860286079
申请日期
1986.12.02
申请人
GENERAL ELECTRIC CO <GE>
发明人
UIRIAMU MAKUMAAREI
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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