发明名称 PROBE TYPE SURFACE SHAPE DETECTOR REQUIRING NO CALIBRATION BY LASER INTERFEROMETER
摘要 PURPOSE:To dispense with calibration by an interferometer, by mounting a reflecting mirror at a position on the opposite side of a probe and arranging both of them on the same straight line as the optical axis of an objective lens to fix the reflecting mirror to the focal position of the objective lens. CONSTITUTION:A lever 4 having a probe 1, a minute reflecting mirror 2 and a balance wt. 3 mounted thereto is held to a holder 6 by a bearing 5, and the holder 6 is fixed to the mirror cylinder 9 of an objective lens 8 while the mirror 2 is positioned in the vicinity of the focal position of the objective lens 8 by a clamp knob 7. A probe position adjusting knob 10 is operated to accurately match the mirror 2 with the focal position of the lens 8. When a measuring object is moved to X- and Y-direction by a specimen position adjusting device, the probe 1 contacted with the surface of the object displaces up and down correspondingly to the uneven shape of the surface of the object. Hereupon, the mirror 2 simultaneously displaces up and down in the same quantity. The converged laser beam 11 passed through the lens 8 is reflected by the mirror 2 and counted in digital quantity as the up-and-down movement of the probe 1, that is, the up-and-down movement of the mirror 2 by a laser interferometer and the uneven shape of the surface of the object is detected.
申请公布号 JPS62212507(A) 申请公布日期 1987.09.18
申请号 JP19860056387 申请日期 1986.03.14
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 SAKANO NORIIKU;TANIMURA YOSHIHISA
分类号 G01B7/28;G01B11/24;G01B11/30 主分类号 G01B7/28
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