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发明名称
IC TESTING APPARATUS
摘要
申请公布号
JPS635280(A)
申请公布日期
1988.01.11
申请号
JP19860146864
申请日期
1986.06.25
申请人
HITACHI LTD
发明人
ORIHASHI RITSURO;KIKUCHI SHUJI
分类号
H03K19/00;G01R31/28;G01R31/319
主分类号
H03K19/00
代理机构
代理人
主权项
地址
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