| 摘要 |
In a circuit board tester for circuit boards equipped on both sides with SMDs (surface-mounted devices), which tests devices under test arranged between probe cards which can be moved relatively towards one another, via contact test probes for component operation and continuity of circuit tracks, the probe cards being movably connected to column guides within a housing, each probe card (1, 2) is allocated, for simultaneously testing the circuit boards 10 arranged at the top and the bottom of the device under test 21, to one of two housing parts (lid 3, housing 4) connected to one another in the manner of a hinge, one of the two probe cards (1, 2) being guided with guide sleeves 5 on guide columns 7, connected to the respective housing part (3, 4) and arranged perpendicularly with respect to a probe card plane (or the associated probe card frame 6) and being pneumatically movable, whilst the in each case other probe card (1, 2) is held floatingly with respect to its housing part (3, 4) and can be automatically fixed in the predetermined position with respect to the circuit board 10 via pins 8 and/or sleeve guides 9 arranged on it and the in each case opposite probe card (1, 2). <IMAGE>
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