发明名称 ON-CHIP THROUGH-BODY-VIA CAPACITORS AND TECHNIQUES FOR FORMING SAME
摘要 Techniques are disclosed for providing on-chip capacitance using through-body-vias (TBVs). In accordance with some embodiments, a TBV may be formed within a semiconductor layer, and a dielectric layer may be formed between the TBV and the surrounding semiconductor layer. The TBV may serve as one electrode (e.g., anode) of a TBV capacitor, and the dielectric layer may serve as the dielectric body of that TBV capacitor. In some embodiments, the semiconductor layer serves as the other electrode (e.g., cathode) of the TBV capacitor. To that end, in some embodiments, the entire semiconductor layer may comprise a low-resistivity material, whereas in some other embodiments, low-resistivity region(s) may be provided just along the sidewalls local to the TBV, for example, by selective doping in those location(s). In other embodiments, a conductive layer formed between the dielectric layer and the semiconductor layer serves as the other electrode (e.g., cathode) of the TBV capacitor.
申请公布号 WO2016209200(A1) 申请公布日期 2016.12.29
申请号 WO2015US36905 申请日期 2015.06.22
申请人 INTEL CORPORATION 发明人 CHEN, Yi Wei;PHOA, Kinyip;NIDHI, Nidhi;LIN, Jui-Yen;SHIH, Kun-Huan;YANG, Xiaodong;HAFEZ, Walid M.;TSAI, Curtis
分类号 H01L21/60 主分类号 H01L21/60
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