发明名称 TEST MONITOR CONTROLLER
摘要 <p>PURPOSE:To easily retrieve a general test to be conducted by providing an conduction period decision condition storage means, a process input means, and a schedule retrieving means. CONSTITUTION:A storage device 31 is provided with the conduction period decision condition storage means for storing the names, etc., of general tests, a conduction history storage means for storing data on the criterion, etc., for measurement data, and an operation storage means for storing operation conditions. An arithmetic processor 32 is provided with the schedule retrieving means, a decision means, etc. Further, a process input/output device 33 is provided with a console panel for operating plant facilities remotely. Then the date of next conduction is calculated based on the frequencies of conduction determined by general test items and the date of the conduction of a last test (conduction history information), and further example tests which can be conducted in a current plant state are selected and displayed without any person's intervention according to the input state of the current plant and the state of a plant required when each general test is conducted.</p>
申请公布号 JPH0263000(A) 申请公布日期 1990.03.02
申请号 JP19880214624 申请日期 1988.08.29
申请人 HITACHI LTD 发明人 MIYAGAWA KATSUHIKO
分类号 G21C17/00;G21D3/00 主分类号 G21C17/00
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