| 摘要 |
An alpha ray observation apparatus (200), according to an embodiment, that observes alpha rays by detecting alpha-ray-caused light generated from an alpha ray source in a to-be-observed object, has: an alpha-ray-caused light wavelength selecting unit (1a) that can select light including wavelength of the alpha-ray-caused light; an alpha-ray-caused light detecting unit (2a) that measures an amount of alpha-ray-caused light; a short-side wavelength selecting unit (1b) that can select light of a short-side wavelength that is shorter than the wavelength of the alpha-ray-caused light; a short-side wavelength light detecting unit (2b); a long-side wavelength selecting unit (1c) that can select light of a long-side wavelength that longer than the wavelength of the alpha-ray-caused light; a long-side wavelength light detecting unit (2c); and a correction unit (4) that calculates a corrected light amount by correcting the amount of the alpha-ray-caused light. |
