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发明名称
PROCESS FOR OPERATING A SEMICONDUCTOR MEMORY WITH INTEGRATED PARALLEL TEST CAPABILITY AND EVALUATION CIRCUIT FOR CARRYING OUT THE PROCESS
摘要
申请公布号
HK23292(A)
申请公布日期
1992.04.03
申请号
HK19920000232
申请日期
1992.03.26
申请人
SIEMENS AKTIENGESELLSCHAFT
发明人
KANTZ, DIETER, DIPL.-ING.;KUCHINKE, GUENTHER, DIPL.-ING.
分类号
G11C29/00;G11C29/26;G11C29/34;(IPC1-7):G06F11/26
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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