| 摘要 |
PROBLEM TO BE SOLVED: To provide a nonlinear characteristic estimation device and a nonlinear characteristic estimation method.SOLUTION: The nonlinear characteristics of a waiting for measurement system can be easily and quickly estimated with high accuracy of the estimation results, by calculating the parameters of a nonlinear model of a waiting for measurement system, by the power of the fundamental wave and the power of the harmonic wave of the output signals at at least two frequency points of a waiting for measurement system, obtained by measurement.SELECTED DRAWING: Figure 1 |
