IMMERSIBLE VACUUM TYPE CRYOSTAT FOR DETERMINING TEMPERATURE RELETIONSHIPS OF SEMICONDUCTOR MATERIAL ELECTRICAL PARAMETERS

摘要

1. Immersible vacuum type cryostat especially for determining temperature relationships between electrical parameters of semiconductor materials containing a metal rod placed in a vacuum chamber characterised in that the metal rod (14) on which an examined sample is attached is separately located inside the metal head (1) which is pressed down to the body (3) containing the pump outlet (5) and pressed down to the plate (6) containing electric seal wires with the use of a sleeve (8) separately connected to the container (9) equipped with test jacks (10).<IMAGE>