发明名称 INFRARED THERMOGRAPH RESOLUTION EVALUATION PATTERN AND INFRARED THERMOGRAPH RESOLUTION EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technique which allows easy grasping of the resolution of an infrared thermograph between regions with different infrared emissivities.SOLUTION: There is provided an infrared thermograph resolution measuring pattern including a first region and a second region on substantially the same surface, the first and second regions each having a first base unit and a second base unit. The first base unit is made of a first material with a first infrared emissivity while the second base unit is made of a second material with a second infrared emissivity, the first and second infrared emissivities being different. The area ratio between the first and second base units is set to be a first area ratio in the first region and be a second area region in the second region, the first and second area ratios being different.SELECTED DRAWING: Figure 4
申请公布号 JP2016173353(A) 申请公布日期 2016.09.29
申请号 JP20150076804 申请日期 2015.04.03
申请人 KOA CORP 发明人 HIRASAWA KOICHI;OGUCHI TOMONORI
分类号 G01J5/00;G01J5/48 主分类号 G01J5/00
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