METHOD AND SYSTEM FOR REVERSING PERFORMANCE DEGRADATION IN SEMI-CONDUCTOR GAMMA RADIATION DETECTORS

摘要

A system reverses degraded energy resolution of semiconductor radiation detection elements ( 44 ) which are used in a radiation detector assembly. A means ( 38 ) identifies semiconductor elements which exhibit degraded energy resolution as compared to an initial level of energy resolution after application of the forward bias. A means ( 40 ) restores the degraded semiconductor elements to the initial level of energy resolution by applying the reverse bias. A heater ( 74 ) accelerates the restoration process by supplying an elevated ambient temperature. A screening means ( 48 ) screens new semiconductor elements to identify the elements which are susceptible to degradation. A forward bias is applied by a forward bias means ( 50 ) to induce the degradation. A heater ( 52 ) increases an ambient temperature to accelerate the performance degradation in the new semiconductor elements. The identified degradable elements are treated with a reverse bias prior to installation in the detector.