SEMICONDUCTOR DEVICE, DISPLAY SYSTEM, AND SIGNAL MONITORING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device, a display system, and a signal monitoring method which allow a circuit scale to be reduced even if signals to be subjected to failure detection are increased.SOLUTION: The semiconductor device comprises N (N is an integer of 2 or more) failure detection parts. A first failure detection part detects a failure of a first signal being a monitored signal with a reference clock generated by a clock source as a monitor signal. An i-th (i is an integer of 2≤i≤N) failure detection part detects a failure of an i-th signal being a monitored signal with an (i-1)-th signal as a monitor signal.SELECTED DRAWING: Figure 3