| 摘要 |
PROBLEM TO BE SOLVED: To suppress rewriting of data stored in a storage circuit accessed by a processing circuit under test even when a scan test is executed.SOLUTION: A semiconductor device according to the present invention comprises: a storage circuit; a processing circuit executing a process using data stored in the storage circuit, and writing data to the storage circuit in response to execution of the process; a scan test circuit executing a scan test on the processing circuit when the processing circuit does not execute the process; and a suppression circuit suppressing the processing circuit from writing data to the storage circuit while the scan test is executed on the processing circuit.SELECTED DRAWING: Figure 28 |
