发明名称 Nitride semiconductor wafer, nitride semiconductor element, and method for manufacturing nitride semiconductor wafer
摘要 A nitride semiconductor wafer includes a silicon substrate, a first layer, a second layer, a third layer, a fourth layer, a fifth layer, and a sixth layer. The first layer is provided on the silicon substrate. The second layer is provided on the first layer. The third layer is provided on the second layer. The fourth layer is provided on the third layer. The fifth layer is provided on the fourth layer. The sixth layer is provided on the fifth layer. A composition ratio x4 of the fourth layer decreases in a first direction from the third layer toward the fifth layer. A maximum value of the composition ratio x4 is not more than a composition ratio of the third layer. A minimum value of the composition ratio x4 is not less than a composition ratio of the fifth layer.
申请公布号 US9472720(B2) 申请公布日期 2016.10.18
申请号 US201615142473 申请日期 2016.04.29
申请人 Kabushiki Kaisha Toshiba 发明人 Kaneko Kei;Kushibe Mitsuhiro;Katsuno Hiroshi;Yamada Shinji;Tajima Jumpei;Ohba Yasuo
分类号 H01L31/0328;H01L33/12;H01L33/00;H01L33/06;H01L33/32;H01L29/15;H01L29/20;H01L21/02;H01L29/201;H01L29/36 主分类号 H01L31/0328
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A nitride semiconductor element, comprising: a silicon substrate; a foundation layer including: a first layer of Alx1Ga1-x1N (0.8≦x1≦1) provided on the silicon substrate;a second layer of Alx2Ga1-x2N (0.7≦x2<0.8) provided on the first layer;a third layer of Alx3Ga1-x3N (0.4≦x3≦0.6) provided on the second layer;a fourth layer of Alx4Ga1-x4N provided on the third layer;a fifth layer of Alx5Ga1-x5N (0.1≦x5≦0.2) provided on the fourth layer; anda sixth layer of Alx6Ga1-x6N (0≦x6<x5) provided on the fifth layer; and a nitride semiconductor layer provided on the foundation layer, the composition ratio x4 of the fourth layer decreasing in a first direction from the third layer toward the fifth layer, a maximum value of the composition ratio x4 being not more than the composition ratio x3 of the third layer, a minimum value of the composition ratio x4 being not less than the composition ratio x5 of the fifth layer.
地址 Minato-ku JP