发明名称 MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a measuring apparatus capable of efficiently measuring the height of a spacer on a mother glass.SOLUTION: A measuring apparatus according to an embodiment measures the height of a main spacer formed on a mother glass for manufacturing a liquid crystal panel, and comprises a base, a plurality of gantries arranged on the base, and a plurality of measuring heads arranged on the plurality of gantries. The plurality of gantries are configured movably in a second direction, and the plurality of measuring heads arranged on the gantries are arranged movably in a first direction intersecting with the second direction.SELECTED DRAWING: Figure 2
申请公布号 JP2016224303(A) 申请公布日期 2016.12.28
申请号 JP20150111382 申请日期 2015.06.01
申请人 TOHO TECHNOLOGY CORP 发明人 KAMIYA SHIGEO;OZEKI KEN
分类号 G02F1/13;G01B11/06 主分类号 G02F1/13
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