发明名称 SAMPLE HOLDER AND PLASMA ETCHING APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To reduce a warpage generated in a ceramic body while securing the reliability of the connection.SOLUTION: A sample holder 10 comprises a ceramic body 1 having a sample holding surface 11 on its upper surface and a concave portion 12 on its lower surface, an electrostatic attraction electrode 2 which spreads along the sample holding surface 11 and is buried in the ceramic body 1, a via hole conductor 4 extending from the electrostatic attraction electrode 2 to the lower surface side of the ceramic body 1, an electrode 5 which is connected to an end of the via hole conductor 4 on the lower surface side of the ceramic body 1 and is provided in a direction along the upper surface of the ceramic body 1 and at least a part of which is exposed in the recess 12, and a lead terminal 9 inserted into the recess 12 and connected to the electrode 5. The portion of the electrode 5 connected to the via hole conductor 4 is thicker than the portion connected to the lead terminal 9.SELECTED DRAWING: Figure 1
申请公布号 JP2016225557(A) 申请公布日期 2016.12.28
申请号 JP20150112805 申请日期 2015.06.03
申请人 KYOCERA CORP 发明人 HORI YOHEI
分类号 H01L21/683;H01L21/3065;H02N13/00 主分类号 H01L21/683
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